Part Number Hot Search : 
LT1020 00P100 FT311D NJM2777V FA551 BSP171 D6433 ISL9206
Product Description
Full Text Search
 

To Download FDZ209N Datasheet File

  If you can't view the Datasheet, Please click here to try to view without PDF Reader .  
 
 


  Datasheet File OCR Text:
 FDZ209N
May 2004
FDZ209N
60V N-Channel PowerTrench BGA MOSFET
General Description
Combining Fairchild's advanced PowerTrench process with state-of-the-art BGA packaging, the FDZ209N minimizes both PCB space and RDS(ON). This BGA MOSFET embodies a breakthrough in packaging technology which enables the device to combine excellent thermal transfer characteristics, high current handling capability, ultra-low profile packaging, low gate charge, and low RDS(ON).
Features
* 4 A, 60 V. RDS(ON) = 80 m @ VGS = 5 V
* Occupies only 5 mm2 of PCB area: only 55% of the area of SSOT-6 * Ultra-thin package: less than 0.80 mm height when mounted to PCB * Outstanding thermal transfer characteristics: 4 times better than SSOT-6 * Ultra-low Qg x RDS(ON) figure-of-merit * High power and current handling capability
Applications
* Solenoid Drivers
D S
D S S D
D S S D
D
Index slot
Index slot
G D
G
Bottom
Top
TA=25oC unless otherwise noted
S
Absolute Maximum Ratings
VDSS VGSS ID
Symbol
PD TJ, TSTG
Drain-Source Voltage Gate-Source Voltage Drain Current - Continuous (Note 1a) - Pulsed Power Dissipation (Steady State) (Note 1a) Operating and Storage Junction Temperature Range
Parameter
60 20 4 20 2 -55 to +150
Ratings
Units
V V A
W C
Thermal Characteristics
RJA RJB RJC
Thermal Resistance, Junction-to-Ambient Thermal Resistance, Junction-to-Ball Thermal Resistance, Junction-to-Case
(Note 1a) (Note 1) (Note 1)
64 8 0.7
C/W
Package Marking and Ordering Information
Device Marking 209N Device FDZ209N Reel Size 7''
Tape width 8mm
Quantity 3000 units
(c)2004 Fairchild Semiconductor Corporation
FDZ209N Rev B2 (W)
FDZ209N
Electrical Characteristics
Symbol
WDSS IAR BVDSS BVDSS TJ IDSS IGSS VGS(th) VGS(th) TJ RDS(on) gFS Ciss Coss Crss RG td(on) tr td(off) tf Qg Qgs Qgd IS VSD trr Qrr
TA = 25 unless otherwise noted C
Parameter
Drain-Source Avalanche Energy Drain-Source Avalanche Current Drain-Source Breakdown Voltage Breakdown Voltage Temperature Coefficient Zero Gate Voltage Drain Current Gate-Body Leakage.
(Note 2)
Test Conditions
Single Pulse, ID= 4 A VGS = 0 V, ID = 250 A ID = 250 A, Referenced to 25C VDS = 48 V, VGS = 20 V, VGS = 0 V VDS = 0 V VDD = 30 V,
Min
Typ
Max Units
90 4 mJ A V mV/C 1 100 A nA V mV/C m S pF pF pF 32 8 27 16 9 ns ns ns ns nC nC nC 1.7 1.2 A V nS nC
Drain-Source Avalanche Ratings (Note 2)
Off Characteristics
60 59
On Characteristics
Gate Threshold Voltage Gate Threshold Voltage Temperature Coefficient Static Drain-Source On-Resistance Forward Transconductance Input Capacitance Output Capacitance Reverse Transfer Capacitance Gate Resistance
(Note 2)
VDS = VGS, ID = 250 A ID = 250 A, Referenced to 25C VGS = 5 V, ID = 4 A VGS = 5 V, ID = 4 A, TJ=125C VDS = 5 V, ID = 4 A VDS = 30 V, f = 1.0 MHz VGS = 15 mV, VDD = 30 V, VGS = 5 V, V GS = 0 V,
1
2.5 -6 60 91 12 657 76 32
3
80 130
Dynamic Characteristics
f = 1.0 MHz ID = 1 A, RGEN = 6
1.5 18 4 15 8
Switching Characteristics
Turn-On Delay Time Turn-On Rise Time Turn-Off Delay Time Turn-Off Fall Time Total Gate Charge Gate-Source Charge Gate-Drain Charge
VDS = 30 V, VGS = 5 V
ID = 4 A,
6.3 2.5 2.5
Drain-Source Diode Characteristics and Maximum Ratings
Maximum Continuous Drain-Source Diode Forward Current Drain-Source Diode Forward VGS = 0 V, IS = 1.7 A Voltage Diode Reverse Recovery Time IF = 4A diF/dt = 100 A/s Diode Reverse Recovery Charge
(Note 2)
0.77 27
(Note 2)
45
Notes: 1. RJA is determined with the device mounted on a 1 in 2 oz. copper pad on a 1.5 x 1.5 in. board of FR-4 material. The thermal resistance from the junction to copper chip carrier. RJC and RJB are guaranteed by design while RJA is determined by the user' board design. s the circuit board side of the solder ball, RJB, is defined for reference. For RJC, the thermal reference point for the case is defined as the top surface of the
a)
64 C/W when mounted on a 1in2 pad of 2 oz copper, 1.5" x 1.5" x 0.062" thick PCB
b)
128 C/W when mounted on a minimum pad of 2 oz copper
Scale 1 : 1 on letter size paper
2.
Pulse Test: Pulse Width < 300s, Duty Cycle < 2.0%
FDZ209N Rev B2 (W)
Dimensional Outline and Pad Layout
FDZ209N
FDZ209N Rev B2 (W)
FDZ209N
Typical Characteristics
20
RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE
VGS = 5.0V
1.8
4.8V 4.5V
ID, DRAIN CURRENT (A)
15
1.6
VGS = 4.0V
1.4
4.3V
10
4.3V
1.2
4.5V
4.8V
5.0V
4.0V
5
3.8V
1
0 0 1 2 3 4 5 6 7 VDS, DRAIN-SOURCE VOLTAGE (V)
0.8 0 5 10 ID, DRAIN CURRENT (A) 15 20
Figure 1. On-Region Characteristics.
Figure 2. On-Resistance Variation with Drain Current and Gate Voltage.
0.35 RDS(ON), ON-RESISTANCE (OHM) ID =2A 0.3 0.25 0.2 0.15 0.1 0.05 0 3 3.5 4 4.5 5 VGS, GATE TO SOURCE VOLTAGE (V) TA = 25oC TA = 125oC
1.8 RDS(ON), NORMALIZED DRAIN-SOURCE ON-RESISTANCE 1.6 1.4 1.2 1 0.8 0.6 0.4 -50 -25 0 25 50 75 100
o
ID = 4A VGS = 5.0V
125
150
TJ, JUNCTION TEMPERATURE ( C)
Figure 3. On-Resistance Variation with Temperature.
20 VDS = 5V ID, DRAIN CURRENT (A) 15 TA = -55 C
o
Figure 4. On-Resistance Variation with Gate-to-Source Voltage.
100 VGS = 0V TA = 125oC 1 0.1 0.01 -55oC 0.001 0.0001
25 C
o
IS, REVERSE DRAIN CURRENT (A)
10
125 C
o
10
25oC
5
0 2 2.5 3 3.5 4 4.5 5 5.5 VGS, GATE TO SOURCE VOLTAGE (V)
0
0.2
0.4
0.6
0.8
1
1.2
VSD, BODY DIODE FORWARD VOLTAGE (V)
Figure 5. Transfer Characteristics.
Figure 6. Body Diode Forward Voltage Variation with Source Current and Temperature.
FDZ209N Rev B2 (W)
FDZ209N
Typical Characteristics
7 VGS, GATE-SOURCE VOLTAGE (V) 6
ID = 4A
VDS = 20V 40V
30V
1000
f = 1MHz VGS = 0 V CISS
800 CAPACITANCE (pF)
5 4 3 2 1 0 0 2 4 6
600
400 COSS
200
CRSS
8 10
0 0 10 20 30 40 50 60 VDS, DRAIN TO SOURCE VOLTAGE (V)
Qg, GATE CHARGE (nC)
Figure 7. Gate Charge Characteristics.
100
Figure 8. Capacitance Characteristics.
50
1ms ID, DRAIN CURRENT (A) 10 100ms 1 VGS = 5.0V SINGLE PULSE RJA = 128oC/W TA = 25oC 0.01 0.1 1 10 100 VDS, DRAIN-SOURCE VOLTAGE (V) DC 1s 10s 10ms
P(pk), PEAK TRANSIENT POWER (W)
RDS(ON) LIMIT
40
SINGLE PULSE RJA = 128 C/W TA = 25 C
30
20
0.1
10
0 0.01
0.1
1
10
100
1000
t1, TIME (sec)
Figure 9. Maximum Safe Operating Area.
Figure 10. Single Pulse Maximum Power Dissipation.
r(t), NORMALIZED EFFECTIVE TRANSIENT THERMAL RESISTANCE
1
D = 0.5 0.2
RJA(t) = r(t) * RJA RJA = 128 C/W P(pk) t2 TJ - TA = P * RJA(t) Duty Cycle, D = t1 / t2
SINGLE PULSE
0.1
0.1 0.05 0.02
t1
0.01
0.01
0.001 0.001
0.01
0.1
1
t1, TIME (sec)
10
100
1000
Figure 11. Transient Thermal Response Curve.
Thermal characterization performed using the conditions described in Note 1b. Transient thermal response will change depending on the circuit board design.
FDZ209N Rev B2 (W)
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks.
ACExTM FAST ActiveArrayTM FASTrTM BottomlessTM FPSTM CoolFETTM FRFETTM CROSSVOLTTM GlobalOptoisolatorTM DOMETM GTOTM EcoSPARKTM HiSeCTM E2CMOSTM I2CTM EnSignaTM i-LoTM FACTTM ImpliedDisconnectTM FACT Quiet SeriesTM
ISOPLANARTM LittleFETTM MICROCOUPLERTM MicroFETTM MicroPakTM MICROWIRETM MSXTM MSXProTM OCXTM OCXProTM OPTOLOGIC Across the board. Around the world.TM OPTOPLANARTM PACMANTM The Power Franchise POPTM Programmable Active DroopTM
Power247TM PowerSaverTM PowerTrench QFET QSTM QT OptoelectronicsTM Quiet SeriesTM RapidConfigureTM RapidConnectTM SerDesTM SILENT SWITCHER SMART STARTTM SPMTM StealthTM
SuperFETTM SuperSOTTM-3 SuperSOTTM-6 SuperSOTTM-8 SyncFETTM TinyLogic TINYOPTOTM TruTranslationTM UHCTM UltraFET VCXTM
DISCLAIMER FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. LIFE SUPPORT POLICY FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 2. A critical component is any component of a life 1. Life support devices or systems are devices or support device or system whose failure to perform can systems which, (a) are intended for surgical implant into be reasonably expected to cause the failure of the life the body, or (b) support or sustain life, or (c) whose support device or system, or to affect its safety or failure to perform when properly used in accordance with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. PRODUCT STATUS DEFINITIONS Definition of Terms Datasheet Identification Advance Information Product Status Formative or In Design Definition This datasheet contains the design specifications for product development. Specifications may change in any manner without notice. This datasheet contains preliminary data, and supplementary data will be published at a later date. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design. This datasheet contains final specifications. Fairchild Semiconductor reserves the right to make changes at any time without notice in order to improve design.
Preliminary
First Production
No Identification Needed
Full Production
Obsolete
Not In Production
This datasheet contains specifications on a product that has been discontinued by Fairchild semiconductor. The datasheet is printed for reference information only.
Rev. I11


▲Up To Search▲   

 
Price & Availability of FDZ209N

All Rights Reserved © IC-ON-LINE 2003 - 2022  

[Add Bookmark] [Contact Us] [Link exchange] [Privacy policy]
Mirror Sites :  [www.datasheet.hk]   [www.maxim4u.com]  [www.ic-on-line.cn] [www.ic-on-line.com] [www.ic-on-line.net] [www.alldatasheet.com.cn] [www.gdcy.com]  [www.gdcy.net]


 . . . . .
  We use cookies to deliver the best possible web experience and assist with our advertising efforts. By continuing to use this site, you consent to the use of cookies. For more information on cookies, please take a look at our Privacy Policy. X